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Proceedings Paper

Image formation in near-field infrared microscopy
Author(s): Dmitrii M. Simanovski; Daniel V. Palanker; Philip Huie; Todd I. Smith
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Paper Abstract

In this paper we discuss the mechanisms of image formation in the mid-IR of a transmission mode near-field microscope are studied. It is found that the amount of light propagating from a sub-wavelength aperture through a flat substrate strongly increases the tip nears the same. This effect tends to generate topographic artifacts in near-field images that can be eliminated through the use of flat sample preparation techniques. The transmitted power is strongly influenced by the refractive index of the sample, leading to a substantial difference between a near-field and a far- field spectrum. A phenomenological model, which makes predictions in good agreement with experiment, describing tunneling of light through a sub-wavelength aperture into a substrate is developed. The model predicts spectral sensitivity enhancement with decreasing aperture size.

Paper Details

Date Published: 21 April 2000
PDF: 7 pages
Proc. SPIE 3922, Scanning and Force Microscopies for Biomedical Applications II, (21 April 2000); doi: 10.1117/12.383347
Show Author Affiliations
Dmitrii M. Simanovski, Stanford Univ. (United States)
Daniel V. Palanker, Stanford Univ. (United States)
Philip Huie, Stanford Univ. (United States)
Todd I. Smith, Stanford Univ. (United States)


Published in SPIE Proceedings Vol. 3922:
Scanning and Force Microscopies for Biomedical Applications II
Shuming Nie; Eiichi Tamiya; Edward S. Yeung, Editor(s)

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