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Proceedings Paper

Test point selection using wavelet transforms for mixed-signal circuits
Author(s): Hsing-Chiang Huang; Andrew K. Chan
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Paper Abstract

With growing complexity of today's ICs, it is desirable to improve traditional testing methods to increase the IC manufacturing throughput. If one can select a limited number of points to test the circuit from a given test pattern, the time required for testing can be greatly reduced. This paper presents a method for circuit testing by combining the wavelet transform and test point selection. An example using an 8-bit D/A converter is used to demonstrate the algorithm.

Paper Details

Date Published: 5 April 2000
PDF: 8 pages
Proc. SPIE 4056, Wavelet Applications VII, (5 April 2000); doi: 10.1117/12.381711
Show Author Affiliations
Hsing-Chiang Huang, Texas A&M Univ. (United States)
Andrew K. Chan, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 4056:
Wavelet Applications VII
Harold H. Szu; Martin Vetterli; William J. Campbell; James R. Buss, Editor(s)

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