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Proceedings Paper

Finding the information of the ellipse from the optical Hough transform
Author(s): Sang-Gug Park; Sung-Young Kim; Jong-Yun Kim; Soo-Joong Kim
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Paper Abstract

A new method to find five parameters of an ellipse from the optical Hough transform results is described. The method employs the Hough transform for detection of a straight line and the 1D analysis of the resultant parameter domain. By using this algorithm, we simulated about the ellipses with different positions, and we obtained the information of the ellipse with 94% accuracy in the worst case. To compare the simulation results with the experimental results, we performed optical experiments by using a HT CGH filter. Through the experiments, we showed that our results were very similar to those of the simulation results.

Paper Details

Date Published: 31 March 2000
PDF: 12 pages
Proc. SPIE 4043, Optical Pattern Recognition XI, (31 March 2000); doi: 10.1117/12.381612
Show Author Affiliations
Sang-Gug Park, Research Institute of Industrial Science & Technology (South Korea)
Sung-Young Kim, Uiduk Univ. (South Korea)
Jong-Yun Kim, Kyungpook National Univ. (South Korea)
Soo-Joong Kim, Kyungpook National Univ. (South Korea)


Published in SPIE Proceedings Vol. 4043:
Optical Pattern Recognition XI
David P. Casasent; Tien-Hsin Chao, Editor(s)

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