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Proceedings Paper

In-vitro evaluation of adhesion to human dentine of different canal sealers after Er:YAG laser application
Author(s): Manoel D. Sousa-Neto; Melissa A. Marchesan; Jesus Djalma Pecora; Aldo Brugnera; Yara T.C. Silva-Sousa; Paulo C. Saquy
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Paper Abstract

Adhesion of endodontic sealers to root canal walls is a property material must have to promote a hermetic seal of the root canal. The present study evaluates the effect of Er:YAG laser applied to human dentine in vitro on adhesion of Grossman, Endomethasone, N-Rickert and Sealer 26 root canal sealers. The crowns of 40 human molars were cut on the occlusal side until a flat dentine surface was obtained. The teeth were divided into 2 groups: group 1, saline solution; group 2, irradiation with Er:YAG laser (KaVo Key Laser 2; 11 mm focal distance, perpendicular to the dentine surface, 4 Hz frequency, 200 mJ energy, 62 J total energy and 313 pulses, one minute application time and 2.25 W power). Five repetitions were done for each sealer and each group. An Instron universal testing machine was used for the adhesion test.The results showed a statistically significant difference at 1% for the sealers and the dentine surface treatments. Sealer 26 showed the best adhesion both with laser application and saline. Application of Er:YAG laser did not alter the adhesion of Grossman, N-Rickert or Endomethasone sealers compared to saline; however, laser application increased the adhesion of Sealer 26.

Paper Details

Date Published: 24 March 2000
PDF: 6 pages
Proc. SPIE 3910, Lasers in Dentistry VI, (24 March 2000); doi: 10.1117/12.380815
Show Author Affiliations
Manoel D. Sousa-Neto, Univ. de Ribeirao Preto (Brazil)
Melissa A. Marchesan, Univ. de Sao Paulo (Brazil)
Jesus Djalma Pecora, Univ. de Sao Paulo (Brazil)
Aldo Brugnera, Univ. Camilo Castelo Branco (Brazil)
Yara T.C. Silva-Sousa, Univ. de Ribeirao Preto (Brazil)
Paulo C. Saquy, Univ. de Ribeirao Preto (Brazil)


Published in SPIE Proceedings Vol. 3910:
Lasers in Dentistry VI
John D. B. Featherstone; Peter Rechmann; Daniel Fried, Editor(s)

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