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Proceedings Paper

Scaling diode-pumped Nd3+ and Yb3+-doped YCa4O(BO3)3 (YCOB) self-frequency doubling lasers
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Paper Abstract

The development of didoe-pumped self-frequency doubling (SFD) YCA4O(BO3)3 (YCOB) crystals doped with ND3+ or YB3+ ions offers an attractive alternative to traditional intra-cavity doubling techniques using a separate non-linear crystal. Here, we summarize the progress of scaling SFD lasers to higher powers. Moreover, we examine the potential and limitations of these devices. While SFD lasers are potentially more compact and less costly, scaling to higher powers in the visible region requires careful assessment of mode matching and cavity mode brightness. Combining optical gain and frequency conversion in the same material requires a compromise between the ideal cavity mode for mode matching and generating the largest available power density of the laser mode for optimum frequency doubling. The lack of adjustment of the cavity mode inherently limits scaling of SFD laser operation when using low brightness high power laser diodes. We have employed a new source developed by Polaroid Corp. using multiple high-brightness laser diodes to investigate the potential of increasing SFD laser output. We have then compared the efficiency of this novel pump technique to a single diode pumped system to determine the importance of brightness of the pump source to SFD operation.

Paper Details

Date Published: 29 March 2000
PDF: 13 pages
Proc. SPIE 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (29 March 2000); doi: 10.1117/12.380555
Show Author Affiliations
Dennis A. Hammons, CREOL/Univ. of Central Florida (United States)
Martin C. Richardson, CREOL/Univ. of Central Florida and Laser Energetics Inc. (United States)
Bruce H. T. Chai, CREOL/Univ. of Central Florida and Crystal Photonics Inc. (United States)
Aland K. Chin, Polaroid Corp. (United States)
Richard A. Jollay, Polaroid Corp. (United States)


Published in SPIE Proceedings Vol. 3945:
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Geoffrey T. Burnham; S. C. Wang; Geoffrey T. Burnham; Xiaoguang He; Kurt J. Linden; S. C. Wang, Editor(s)

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