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Proceedings Paper

Highly reliable buried-stripe type 980-nm laser diodes for practical optical communications
Author(s): Hideyoshi Horie; Hirotaka Ohta; Yoshitaka Yamamoto; Nobuhiro Arai; Brian Kelly; Toshinari Fujimori; Hideki Gotoh; Masashi Usami; Yuichi Matsushima
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Paper Abstract

We have developed high power and highly reliable single-mode 980 nm laser diodes (LDs) as an excitation light source for erbium doped fiber amplifiers (EDFAs) for practical communication usage. We designed buried-stripe type 980 nm LDs with a weakly index guided structure to maintain a stable single transverse mode even in high power output operation. Regarding the typical initial device characteristics, a kink level of 315 plus or minus 15 mW was realized and the devices showed maximum light output powers of over 550 mW at 25 degrees Celsius and complete thermal rollover characteristics measured at temperatures up to 150 degrees Celsius with 800 mA current injection. In electrostatic discharge (ESD) tests, no significant change of light output and/or voltage versus current characteristics after forward bias discharges typically up to about plus 12 kV and reverse up to -30 kV (equipment limitation) was found. Regarding the reliability, we carried out long-term aging tests at 120 mW light output power at 50 degrees Celsius. In the tests, we confirmed no sudden failure and very stable spectral characteristics. In addition, we obtained similar degradation rates over different device groups. Furthermore, 150 - 250 mW light output aging tests also showed stable operation. The characteristics of these devices make them suitable for practical communication applications.

Paper Details

Date Published: 29 March 2000
PDF: 13 pages
Proc. SPIE 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (29 March 2000); doi: 10.1117/12.380545
Show Author Affiliations
Hideyoshi Horie, Mitsubishi Chemical Corp. (Japan)
Hirotaka Ohta, Mitsubishi Chemical Corp. (Japan)
Yoshitaka Yamamoto, Mitsubishi Chemical Corp. (Japan)
Nobuhiro Arai, Mitsubishi Chemical Corp. (Japan)
Brian Kelly, Mitsubishi Chemical Corp. (Japan)
Toshinari Fujimori, Mitsubishi Chemical Corp. (Japan)
Hideki Gotoh, Mitsubishi Chemical Corp. (Japan)
Masashi Usami, KDD Corp. (Japan)
Yuichi Matsushima, KDD Corp. (Japan)


Published in SPIE Proceedings Vol. 3945:
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Geoffrey T. Burnham; Xiaoguang He; Kurt J. Linden; S. C. Wang; S. C. Wang; Geoffrey T. Burnham, Editor(s)

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