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Proceedings Paper

Oscillation wavelength shifts of laser diodes with or without a package in a magnetic field
Author(s): Takashi Sato; Takayuki Nakagawa; Akinori Nishiie; Yasuaki Ohsawa; Masashi Ohkawa; Takeo Maruyama; Minoru Shimba
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Paper Abstract

We have measured the oscillation characteristic shifts of laser diodes originated from a magnetic field. We observed wavelength shifts toward the longer wavelength side, i.e., a red shift, by using the beat note between test and reference lasers at room temperature in more than five different laser types, whereas the experiments in early 60s showed a blue shift at extremely low temperature and in a very strong magnetic field. We also observed output power shifts toward the lower power side. Both characteristic shifts showed the same tendencies at increased temperature. So, we considered the magnetic field increases the temperature of the laser diodes and then two characteristics will change. Our experiment, however, showed that the amounts of changes in temperature, estimated from each characteristic shift, do not coincide with each other. At the first stage of our experiment, we removed the packaging parts of laser diodes because they are made of ferromagnetic materials. However, we recently observed the wavelength shifts using the laser diodes with the packaging parts. We are now expecting the changes of the current flow around the active region in the magnetic field can explain this discrepancy by using the correlation analysis between these two shifts.

Paper Details

Date Published: 29 March 2000
PDF: 8 pages
Proc. SPIE 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (29 March 2000); doi: 10.1117/12.380539
Show Author Affiliations
Takashi Sato, Niigata Univ. (Japan)
Takayuki Nakagawa, Niigata Univ. (Japan)
Akinori Nishiie, Niigata Univ. (Japan)
Yasuaki Ohsawa, Niigata Univ. (Japan)
Masashi Ohkawa, Niigata Univ. (Japan)
Takeo Maruyama, Niigata Univ. (Japan)
Minoru Shimba, Tokyo Denki Univ. (Japan)


Published in SPIE Proceedings Vol. 3945:
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Geoffrey T. Burnham; Xiaoguang He; Kurt J. Linden; S. C. Wang; S. C. Wang; Geoffrey T. Burnham, Editor(s)

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