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Proceedings Paper

Application of laser wavelength standard to interferometry measurements in air with nanometric accuracy
Author(s): Suat Topcu; Jean-Pierre Wallerand; Yasser Alayli; Patrick Juncar
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Paper Abstract

This paper presents a comparison between interferometric heterodyne measurements of a commercial system (Axiom 2/20, Zygo) with its frequency stabilized He-Ne laser source and the same apparatus whose laser source has been replaced by our wavelength stabilized laser diode. The aim of this paper is only to demonstrate the feasibility of length measurements by interferometric techniques using new type of laser source which is insensitive to fluctuations of the refractive index of air.

Paper Details

Date Published: 29 March 2000
PDF: 8 pages
Proc. SPIE 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (29 March 2000); doi: 10.1117/12.380528
Show Author Affiliations
Suat Topcu, Univ. de Technologie de Compiegne (France)
Jean-Pierre Wallerand, Conservatoire National des Arts et Metiers (France)
Yasser Alayli, Univ. de Technologie de Compiegne (France)
Patrick Juncar, Conservatoire National des Arts et Metiers (France)


Published in SPIE Proceedings Vol. 3945:
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Geoffrey T. Burnham; S. C. Wang; Geoffrey T. Burnham; Xiaoguang He; Kurt J. Linden; S. C. Wang, Editor(s)

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