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Proceedings Paper

Intelligent high-sensitivity CCD line scan camera with embedded image processing algorithms
Author(s): Dan A. Lehotsky
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Paper Abstract

A high performance, high sensitivity, CCD line scan camera for use in machine vision systems is presented. The camera incorporates an on-board micro-controller as well as PLD's (programmable logic devices) that allow computer control of image acquisition, image processing, and image analysis. The micro-controller/PLD combination provide embedded image processing/analysis capability whereby data compression can be achieved thus reducing the system hardware requirements. Users have control over algorithm parameters thus allowing for dynamic changes in the inspection target. Algorithms and micro-controller firmware are completely in-system programmable via a serial communications link. Static and adaptive gray scale thresholding algorithms are presented as well as a sample application where a maximum of twenty cameras can be networked together to a single host computer. Applications for the camera include web inspection, parts inspection, template matching and gauging.

Paper Details

Date Published: 21 March 2000
PDF: 8 pages
Proc. SPIE 3966, Machine Vision Applications in Industrial Inspection VIII, (21 March 2000); doi: 10.1117/12.380097
Show Author Affiliations
Dan A. Lehotsky, DALSA Inc. (Canada)

Published in SPIE Proceedings Vol. 3966:
Machine Vision Applications in Industrial Inspection VIII
Kenneth W. Tobin Jr.; John C. Stover, Editor(s)

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