Share Email Print
cover

Proceedings Paper

Novel object detection method by probability velocity field
Author(s): Yulong Cao; Jingyu Yang; Mingwu Ren; Wen Jie Yang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the paper, an on-line detecting system for ships in lock is presented. The system has three functions: (1) judging whether there are ships in lock in time; (2) detecting whether ships cross the forbidden lines in lock; (3) observing whether there are ships out of lock. First, a Gaussian probability distribution model (probability field) is generated from the gray-level histogram to diminish the affection of shades of buildings and white speckles by bright light. Second a fundamental optical flow method based on spatio-temporal intensity derivatives is used to calculate normal velocity field of image sequences. Third, a probability velocity field is defined and generated by combining the velocity field with probability field. Two calculating methods about probability velocity field are presented, one method is multiplying probability value with magnitude of velocity field, and the other is using probability field to compute the velocity field. Finally, a movement block detection method is designed according to probability velocity field. And the method not only detects the size and position of movement blocks, but also obtains the direction of movement blocks. These methods have been tested and installed successfully in the temporary ship lock of the Three Gorges Project (TGP).

Paper Details

Date Published: 21 March 2000
PDF: 6 pages
Proc. SPIE 3966, Machine Vision Applications in Industrial Inspection VIII, (21 March 2000); doi: 10.1117/12.380085
Show Author Affiliations
Yulong Cao, Nanjing Univ. of Science and Technology (China)
Jingyu Yang, Nanjing Univ. of Science and Technology (China)
Mingwu Ren, Nanjing Univ. of Science and Technology (China)
Wen Jie Yang, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 3966:
Machine Vision Applications in Industrial Inspection VIII
Kenneth W. Tobin; John C. Stover, Editor(s)

© SPIE. Terms of Use
Back to Top