Share Email Print

Proceedings Paper

Machine vision for solar cell characterization
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An in-line, non-destructive process is being developed for characterizing polycrystalline thin-film and other large area electronic devices using computer vision based imaging of the manufacturing and inspection steps during the device fabrication process. This process is being applied specifically to Cadmium Telluride/Cadmium Sulfide (CdTe/CdS) thin film, polycrystalline solar cells. Our process involves the acquisition of reflective, transmission and electroluminescence (EL) intensity images for each device. The EL intensity images have been processed by use of a modified median cut segmentation. The processed images reveal different gray level regions corresponding to different intensities of EL originating from radiative recombination events occurring within a biased solar cell. Higher efficiency devices show a more uniform intensity distribution in contrast with lower efficiency devices. The uniform intensity regions are made up of gray level intensity values found near the mean of the histogram distribution these are identified as regions of good device performance and are attributed to better material quality and processing. Low intensity regions indicate either material defects or errors in processing. This novel characterization process and analysis are providing new insights into the causes of poor performance in CdTe-based solar cells.

Paper Details

Date Published: 21 March 2000
PDF: 11 pages
Proc. SPIE 3966, Machine Vision Applications in Industrial Inspection VIII, (21 March 2000); doi: 10.1117/12.380078
Show Author Affiliations
Miguel Angel Ordaz, Univ. of Texas/El Paso (United States)
Gregory B. Lush, Univ. of Texas/El Paso (United States)

Published in SPIE Proceedings Vol. 3966:
Machine Vision Applications in Industrial Inspection VIII
Kenneth W. Tobin; John C. Stover, Editor(s)

© SPIE. Terms of Use
Back to Top