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Proceedings Paper

Third order nonlinearity characterization of optical waveguides
Author(s): Frederic Louradour; E. Lopez-Lago; V. Messager; Vincent Couderc; Alain Barthelemy
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Paper Abstract

We propose and demonstrate a new and simple technique for characterization of fast third order optical nonlinearity of wave-guides and bulk materials. Z-scan method, proposed and developed or bulk materials, has been preferred by experimentalists. It investigates nonlinear spatial distortion induced on a focused laser beam. In fact the technique that we present here, which we have called 'D- scan', is the temporal analog of the spatial Z-scan. It is based on spectral changes of a femtosecond pulse according to the dispersion preliminary introduced on the input femtosecond pulse by a dispersive delay line. The nonlinear evolution of the output spectrum when the dispersion introduced at the input is varied from negative to positive gives a sensitive measurement of the complex third order nonlinearity. The imaginary part of nonlinear susceptibility can be deduced from the evolution of the total average transmitted power versus the input dispersion. More, the plot of the position of center of the output spectrum may be exploited to measure the refractive index change time response. In order to demonstrate the capability of the proposed method we have experimentally retrieve the standard value of the nonlinear coefficient n2 of silica during characterization of a short samples of a single-mode optical fiber.

Paper Details

Date Published: 24 March 2000
PDF: 8 pages
Proc. SPIE 3936, Integrated Optics Devices IV, (24 March 2000); doi: 10.1117/12.379959
Show Author Affiliations
Frederic Louradour, CNR/IRCOM and Univ. de Limoges (France)
E. Lopez-Lago, CNR/IRCOM and Univ. de Limoges (France)
V. Messager, CNR/IRCOM and Univ. de Limoges (France)
Vincent Couderc, CNR/IRCOM and Univ. de Limoges (France)
Alain Barthelemy, CNR/IRCOM and Univ. de Limoges (France)


Published in SPIE Proceedings Vol. 3936:
Integrated Optics Devices IV
Giancarlo C. Righini; Seppo Honkanen, Editor(s)

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