Share Email Print
cover

Proceedings Paper

Diffraction patterns and limits of Brewster angle ellipsometry
Author(s): L. Froehly; Isabelle Verrier; Claude Froehly; Gerald Brun; C. Veillas
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Vectorial Modulation Transfer Function (VMTF) calculation will be used for the explanation of diffraction patterns obtained with Brewster ellipsometers. The method used to study these phenomena lays on protection of the incident monochromatic distribution on a basis constituted of monochromatic plane wave components. The first point examined is how the plane wave spectrum could be propagated through a polarizing pate considering the polarization distortions introduced by diffraction. The same calculation is realized for the whole system in order to establish the expression of the whole VMTF. Paraxial approximations are used in order to analyze more easily the reflected beam pattern and to compare it with experimental results. The good agreement between experimental results and model allows a quantitative valuation of index measurement accuracy as a function of the interface mean surface roughness of the experimental sample considering the specular reflection on the homogeneous plane interface. Taking into account the amount of light scatter by the interfaces irregularities it is then possible to specify the theoretical uncertainties limits affecting as well refractive index and refractive index gradients measurements.

Paper Details

Date Published: 24 March 2000
PDF: 8 pages
Proc. SPIE 3936, Integrated Optics Devices IV, (24 March 2000); doi: 10.1117/12.379937
Show Author Affiliations
L. Froehly, Angenieux SA (France) and Univ. de Saint-Etienne (France)
Isabelle Verrier, Univ. de Saint-Etienne (France)
Claude Froehly, IRCOM (France)
Gerald Brun, Univ. de Saint-Etienne (France)
C. Veillas, Univ. de Saint-Etienne (France)


Published in SPIE Proceedings Vol. 3936:
Integrated Optics Devices IV
Giancarlo C. Righini; Seppo Honkanen, Editor(s)

© SPIE. Terms of Use
Back to Top