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Proceedings Paper

Novel technique for characterizing integrated optical waveguides
Author(s): Jefferson E. Odhner; Bipin K. Singh; Joung C. Ha
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Paper Abstract

A novel approach to characterizing integrated optical waveguides is described in which laser light illuminates the surface normal of the waveguide substrate and the transmitted light observed in the far field uniquely describes a number of physical characteristics of the waveguide. The proof of concept has been demonstrated with a HeNe laser on an ion diffused waveguide in silica glass but the technique is applicable to any integrated otpical waveguide. The advantages of this approach are that it is a great deal less expensive than conventional approaches using a Nemarski microscope or an EDAX attachment to an electron microscope and is very simple to set up. The small index variations that comprise a waveguide on a substrate are normally invisible . However, using this technique, when laser light is scanned across the waveguide, a unique pattern is seen in the far field that can be interpreted to not only determine the location of the waveguide, a unique pattern is seen in the far field that can be interpreted to not only determine the location of the waveguides but also certain physical characteristics about them.

Paper Details

Date Published: 24 March 2000
PDF: 9 pages
Proc. SPIE 3936, Integrated Optics Devices IV, (24 March 2000); doi: 10.1117/12.379936
Show Author Affiliations
Jefferson E. Odhner, IntelliSense Corp. (United States)
Bipin K. Singh, IntelliSense Corp. (United States)
Joung C. Ha, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 3936:
Integrated Optics Devices IV
Giancarlo C. Righini; Seppo Honkanen, Editor(s)

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