Share Email Print

Proceedings Paper

Parametric processes in GaAs/Alox structures
Author(s): Vincent Berger; Giuseppe Leo; Alfredo DeRossi; Michel Calligaro; Xavier Marcadet; Andrea Fiore; Julien Nagle
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We discuss here the feasibility of an optical parametric oscillator integrated on a GaAs chip, after reviewing the recent frequency conversion experiments using from birefringence in GaAs/oxidized-AlAs (Alox) waveguides. Recently, phase-matching has been demonstrated for the first time in a GaAs-based waveguide, using form birefringence in multilayer heterostructures GaAs/Alox. Birefringence n(TE)- n(TM) from 0.15 to 0.2 have been measured for different GaAs/Alox waveguides, which is sufficient to phase match mid-IR generation between 3 micrometers and 10 micrometers by difference frequency generation form two near-IR beams. A second step was the observation of parametric fluorescence. Results on parametric fluorescence at 2.1 micrometers will be described, in an oxidized AlGaAs form-birefringent waveguide, consisting of a high-index, strongly birefringent GaAs-Alox core embedded in an AlGaAs cladding. One of the most existing perspectives opened with this new type of nonlinear material is the realization of an optical parametric oscillator on a GaAs chip. To this aim, minimization of losses is the most crucial point. A typical calculated value of this threshold is less than 70 mW for 1 cm-1 losses, and with 90 percent reflection coefficients. The level of losses has been reduced from 2 cm-1 in ridges obtained by a standard reactive ion etching technique, to less than 0.5 cm-1 in ridges realized with a more refined reactive ion etching process, using a 'three layer' mask. There is still a need for an improvement of the waveguide fabrication process, before reaching the oscillation threshold.

Paper Details

Date Published: 23 March 2000
PDF: 14 pages
Proc. SPIE 3928, Nonlinear Materials, Devices, and Applications, (23 March 2000); doi: 10.1117/12.379906
Show Author Affiliations
Vincent Berger, Thomson-CSF (France)
Giuseppe Leo, Thomson-CSF (Italy)
Alfredo DeRossi, Thomson-CSF (Italy)
Michel Calligaro, Thomson-CSF (France)
Xavier Marcadet, Thomson-CSF (France)
Andrea Fiore, Thomson-CSF (Switzerland)
Julien Nagle, Thomson-CSF (France)

Published in SPIE Proceedings Vol. 3928:
Nonlinear Materials, Devices, and Applications
Jeffrey W. Pierce, Editor(s)

© SPIE. Terms of Use
Back to Top