Share Email Print
cover

Proceedings Paper

Morphological multiscale shape analysis of light micrographs
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Shape analysis of light-micrographs of cell populations is important for cytotoxicity evolution. This paper presents a morphological method for quantitative analysis of shape deformations of cells in contact to a biomaterial. After illumination normalization, a morphological multiscale segmentation yields separated cells. Shape deformation, and hence, toxicity of the substance under scrutiny, is quantified by means of compactness distribution and pattern spectrum of the population. Since the logarithmic image model is applicable to transmitted light, illumination normalization is achieved by removing the illumination component from the log- image by a tophat transform utilizing a large reconstruction filter. Subsequent thresholding and noise filtering yields connected binary cells, which are segmented by a marker-based, multiscale approach. For this, size-specific marker scales are generated removing noise and false markers. Each cell is now represented by an isolated marker. Converse integration of marker scales is performed by successive reconstruction of the original cell shapes, preventing merging of markers. Our method yields reasonable cell segmentations that go along with cell morphology even for differently sized and very distinct shapes. The obtained quantitative data is significantly correlated to the toxicity of the substance to be evaluated. Currently, the method is used for extensive biocompatibility tests.

Paper Details

Date Published: 3 March 2000
PDF: 12 pages
Proc. SPIE 3961, Nonlinear Image Processing XI, (3 March 2000); doi: 10.1117/12.379396
Show Author Affiliations
Volker H. Metzler, Medical Univ. of Luebeck (Germany)
Thomas Martin Lehmann, Technical Univ. Aachen (Germany)
Til Aach, Medical Univ. of Luebeck (Germany)


Published in SPIE Proceedings Vol. 3961:
Nonlinear Image Processing XI
Edward R. Dougherty; Jaakko T. Astola, Editor(s)

© SPIE. Terms of Use
Back to Top