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Proceedings Paper

Thermographic profiles on optical surfaces: from insulators to metals
Author(s): Rashmi S. Shah; Alan F. Stewart; Jerry Ray Bettis; Lynn Bonsall
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Paper Abstract

IR thermal imagin has been sued to study absorption in coated optical surface.s THis technique has demonstrated the ability to rapidly determine coating quality on thermally insulating substrates such as fused silica. The application of this technique to coatings deposited on thermal conductive substrates such as sapphire, silicon or copper is discussed. Data and the result of modeling are compared to show the limitations and potential of this technique for measurement and study of different classes of optical components.

Paper Details

Date Published: 3 March 2000
PDF: 11 pages
Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); doi: 10.1117/12.379349
Show Author Affiliations
Rashmi S. Shah, Boeing Co. (United States)
Alan F. Stewart, Boeing Co. (United States)
Jerry Ray Bettis, Boeing Co. (United States)
Lynn Bonsall, Boeing Co. (United States)

Published in SPIE Proceedings Vol. 3902:
Laser-Induced Damage in Optical Materials: 1999
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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