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Linear and nonlinear contributions on the dielectric response of zirconia and polyethylene films
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Paper Abstract

Using the LOCALF method, we have examined electric field distributions for high and low dielectric susceptibility cases through systematic variations of defect concentration and orientation. The addition of nonlinear susceptibility terms to the conventional linear contributions in the dielectric formalism incrementally perturbs both the electric field intensities and predicted dielectric constants, having a greater influence on low dielectric materials. These effects are modulate by the relative ratios of the linear and nonlinear susceptibility terms for a material due to polarization-derived changes. Nonlinear effects can have a strong influence on the magnitude of these changes; potentially obscuring predicted changes in dielectric response due to microstructural detail.

Paper Details

Date Published: 3 March 2000
PDF: 9 pages
Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); doi: 10.1117/12.379330
Show Author Affiliations
Kim F. Ferris, Pacific Northwest National Lab. (United States)
Gregory J. Exarhos, Pacific Northwest National Lab. (United States)
Steven M. Risser, Battelle Memorial Institute (United States)

Published in SPIE Proceedings Vol. 3902:
Laser-Induced Damage in Optical Materials: 1999
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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