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Proceedings Paper

High-speed camera based on a CMOS active pixel sensor
Author(s): Hans S. Bloss; Juergen D. Ernst; Heidrun Firla; Sybille C. Schmoelz; Stephan K. Gick; Stefan C. Lauxtermann
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Paper Abstract

Standard CMOS technologies offer great flexibility in the design of image sensors, which is a big advantage especially for high framerate system. For this application we have integrated an active pixel sensor with 256 X 256 pixel using a standard 0.5 micrometers CMOS technologies. With 16 analog outputs and a clockrate of 25-30 MHz per output, a continuous framerate of more than 50000 Hz is achieved. A global synchronous shutter is provided, but it required a more complex pixel circuit of five transistors and a special pixel layout to get a good optical fill factor. The active area of the photodiode is 9 X 9 micrometers . These square diodes are arranged in a chess pattern, while the remaining space is used for the electronic circuit. FIll factor is nearly 50 percent. The sensor is embedded in a high-speed camera system with 16 ADCs, 256Mbyte dynamic RAM, FPGAs for high-speed real time image processing, and a PC for user interface, data archive and network operation. Fixed pattern noise, which is always a problem of CMOS sensor, and the mismatching of the 16 analog channels is removed by a pixelwise gain-offset correction. After this, the chess pattern requires a reconstruction of all the 'missing' pixels, which can be done by a special edge sensitive algorithm. So a high quality 512 X 256 image with low remaining noise can be displayed. Sensor, architecture and processing are also suitable for color imaging.

Paper Details

Date Published: 29 February 2000
PDF: 8 pages
Proc. SPIE 3968, High-Speed Imaging and Sequence Analysis II, (29 February 2000); doi: 10.1117/12.378878
Show Author Affiliations
Hans S. Bloss, Fraunhofer Institute for Integrated Circuits (Germany)
Juergen D. Ernst, Fraunhofer Institute for Integrated Circuits (Germany)
Heidrun Firla, Fraunhofer Institute for Integrated Circuits (Germany)
Sybille C. Schmoelz, Fraunhofer Institute for Integrated Circuits (Germany)
Stephan K. Gick, Fraunhofer Institute for Integrated Circuits (Germany)
Stefan C. Lauxtermann, Ctr. Suisse d'Electronique et de Microtechnique (Switzerland)


Published in SPIE Proceedings Vol. 3968:
High-Speed Imaging and Sequence Analysis II
Alan M. Frank; James S. Walton; James S. Walton, Editor(s)

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