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Proceedings Paper

Characterization of coated optical components by laser calorimetry
Author(s): Tiberiu Visan; Dan G. Sporea
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Paper Abstract

This paper present a new computing procedure for measuring the bulk absorption coefficient of the laser optical components that present a layered structure as the coated otpical components. Previously, this measurement has ben conducted usually by laser calorimetry with the procedures provided by ISO 11551. However these methods assume the probes to be homogenous and for the inhomogeneous samples this assumption may introduce significant errors in the value of the absorption coefficient. The method is based upon the general solution of the heat diffusion equation calculated for an optical component irradiated by a laser beam with all parameters known. Because the optical component has a layered structure, in order to obtain the solution of the mentioned equation in each layer, a system of heat equations has to be solved. The solutions of this system correspond to the diffusion in each layer and they strongly depend upon the absorption coefficient of each layer. Due to the fact that the values for absorption coefficient are small for the studied samples, these solutions are developed in Taylor series with respect to the absorption coefficient. This development leads to a set of algebraic equations that provides the absorption coefficient value of each layer if the temperature in one point of that layer is known. This method has been experimentally tested by evaluating the absorption coefficient of a ZnSe sample with an AR coating of BaF2 and the result proved to be in agreement with the results obtained by numerically simulating this process.

Paper Details

Date Published: 23 February 2000
PDF: 6 pages
Proc. SPIE 4068, SIOEL '99: Sixth Symposium on Optoelectronics, (23 February 2000); doi: 10.1117/12.378672
Show Author Affiliations
Tiberiu Visan, National Institute for Laser, Plasma and Radiation Physics (Canada)
Dan G. Sporea, National Institute for Laser, Plasma and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 4068:
SIOEL '99: Sixth Symposium on Optoelectronics
Teodor Necsoiu; Maria Robu; Dan C. Dumitras, Editor(s)

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