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Proceedings Paper

CaS:Eu,Sm films prepared by pulsed laser deposition
Author(s): Wenhui Fan; Wei Zhao; Ying Liu; Wenhua Zhu; Xun Hou
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Paper Abstract

Electron trapping thin films CaS:Eu,Sm have been deposited by pulsed laser deposition in vacuum and simultaneous sulfur coevaporation. The films prepared by doubly rare-earth ions doped alkaline earth sulfides CaS have the characteristics of infrared upconversion and optical storage. Its phases and microstructures were identified by X-ray diffraction. The chemical composition of the films was determined by secondary ion mass spectrum. The studies on the optical properties of the films show they can convert the infrared light (800 - 1600 nm) to red light (approximately 672 nm). Infrared upconversion efficiency of CaS:Eu,Sm thin films with different thickness has been investigated by using the ultrashort infrared laser with different FWHM from microsecond(s) to ps. It is shown the upconversion efficiency of CaS:Eu,Sm thin films not only depends on the growth conditions and the post annealing process, but also has the `exhaustion' phenomenon. By means of measuring transmittance and spatial resolution of CaS:Eu,Sm thin films, the post annealing process was found to promote grain growth which could obviously improve upconversion efficiency of CaS:Eu,Sm thin films, even though it had negative influence on transmittance and spatial resolution of CaS:Eu,Sm thin films.

Paper Details

Date Published: 1 February 2000
PDF: 6 pages
Proc. SPIE 3885, High-Power Laser Ablation II, (1 February 2000); doi: 10.1117/12.376978
Show Author Affiliations
Wenhui Fan, Xi'an Jiaotong Univ. and State Key Lab. of Transient Optics and Technology (China)
Wei Zhao, State Key Lab. of Transient Optics and Technology (China)
Ying Liu, State Key Lab. of Transient Optics and Technology (China)
Wenhua Zhu, State Key Lab. of Transient Optics and Technology (China)
Xun Hou, State Key Lab. of Transient Optics and Technology (China)


Published in SPIE Proceedings Vol. 3885:
High-Power Laser Ablation II
Claude R. Phipps; Masayuki Niino, Editor(s)

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