Share Email Print
cover

Proceedings Paper

Laser dark-field microscope: investigation of the motility of submicroscopic structures
Author(s): Alexander Yu. Krol; Valery V. Malev; Alexei A. Vereninov
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Some years ago we have built a dark-field microscope based on a catadioptric objective used as a dark-field condenser. The apparatus allowed to measure small (tens of nm) transverse displacements of light-scattering micro-objects, such as cell margins or intracellular particles. The principle of apparatus was the registration of the change in the intensity of light scattered from a moving structure that goes in or out the small scattering area (0.5 X 0.5 micrometers ). Recently, we have improved the method by equipping the microscope with a low power He-Ne laser. Highly coherent laser beam focused on the micro-object did not allow to form a real micro-image, but allowed to measure small displacements of the scattering structure via registration of the changes in the intensity of light scattered from the structure moving across the focused spot of laser light. Using the laser as a light source lead to an enhancement of the sensitivity of the apparatus, allowing the registration of displacements with amplitudes down to 1 - 2 nm.

Paper Details

Date Published: 25 January 2000
PDF: 4 pages
Proc. SPIE 4064, Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (25 January 2000); doi: 10.1117/12.375463
Show Author Affiliations
Alexander Yu. Krol, Institute of Cytology (Russia)
Valery V. Malev, Institute of Cytology (Russia)
Alexei A. Vereninov, Institute of Cytology (Russia)


Published in SPIE Proceedings Vol. 4064:
Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

© SPIE. Terms of Use
Back to Top