Share Email Print

Proceedings Paper

Optical and magnetic properties for erbium-related centers in self-assembled silicon nanostructures
Author(s): Nikolai T. Bagraev; Alexei D. Bouravleuv; Wolfgang Gehlhoff; Leonid E. Klyachkin; Anna M. Malyarenko; Margarita M. Mezdrogina; Alexander Naeser; Vladimir V. Romanov; Serguei A. Rykov
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present the first findings of high efficient Er3+- related electroluminescence 4I13/2 yields 4I13/2 from self-assembled silicon nanostructures with sizes varying from 1.0 to 10 nm that are naturally prepared as a subsequence of quantum-size n--p junctions. The built-in electric field induced by these n+-p junctions is found to result in the Stark effect that perturbs strong sp-f mixing due to the electron-hole localization on the Er3+-ions incorporated into nanostructures. This spatial confinement is shown to cause ultrafast energy transfer to the erbium-related centers which increases with decreasing size of nanostructures thereby enhancing the electroluminescent efficiency.

Paper Details

Date Published: 25 January 2000
PDF: 6 pages
Proc. SPIE 4064, Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (25 January 2000); doi: 10.1117/12.375415
Show Author Affiliations
Nikolai T. Bagraev, A.F. Ioffe Physical-Technical Institute (Russia)
Alexei D. Bouravleuv, A.F. Ioffe Physical-Technical Institute (Russia)
Wolfgang Gehlhoff, Technische Univ. Berlin (Germany)
Leonid E. Klyachkin, A.F. Ioffe Physical-Technical Institute (Russia)
Anna M. Malyarenko, A.F. Ioffe Physical-Technical Institute (Russia)
Margarita M. Mezdrogina, A.F. Ioffe Physical-Technical Institute (Russia)
Alexander Naeser, Technische Univ. Berlin (Germany)
Vladimir V. Romanov, St. Petersburg State Technical Univ. (Russia)
Serguei A. Rykov, St. Petersburg State Technical Univ. (Russia)

Published in SPIE Proceedings Vol. 4064:
Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

© SPIE. Terms of Use
Back to Top