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Proceedings Paper

Phase response of quantum staircase in modulated quantum wires
Author(s): Nikolai T. Bagraev; Vadim K. Ivanov; Leonid E. Klyachkin; Anna M. Malyarenko; Serguei A. Rykov; Ivan A. Shelykh
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Paper Abstract

We present the findings of the quantized conductance in a modulated quantum wire. The energy dependence of the transmission coefficient through a smooth and modulated quantum wire is analyzed to define the role of elastic back scattering process in the formation of the conductance oscillations and the current staircase. We demonstrate the oscillations of 1D conductance plateaus as a function of drain-source voltage that are evidence of the interference effects caused by varying the energy of ballistic holes in the modulated quantum wire electrostatically created inside the silicon self-assembled quantum well. The Aharonov-Bohm (AB) rings prepared inside the silicon self-assembled quantum wells are used to study the interference of ballistic carriers tunneling through parallel quantum wires as a function of their length and modulation which are revealed by varying the external magnetic field and the drain-source voltage. The AB double-path interferometer defined by the quantum point contacts from the leads is found to exhibit the periodic oscillations in the quantized conductance that are evidence of the magnitude and phase of the transmission coefficient through the quantum wire embedded within the AB ring's arm.

Paper Details

Date Published: 25 January 2000
PDF: 10 pages
Proc. SPIE 4064, Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (25 January 2000); doi: 10.1117/12.375414
Show Author Affiliations
Nikolai T. Bagraev, A.F. Ioffe Physical-Technical Institute (Russia)
Vadim K. Ivanov, St. Petersburg State Technical Univ. (Russia)
Leonid E. Klyachkin, A.F. Ioffe Physical-Technical Institute (Russia)
Anna M. Malyarenko, A.F. Ioffe Physical-Technical Institute (Russia)
Serguei A. Rykov, St. Petersburg State Technical Univ. (Russia)
Ivan A. Shelykh, St. Petersburg State Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 4064:
Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
Alexander I. Melker, Editor(s)

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