Share Email Print

Proceedings Paper

X-ray emissions from clusters excited by ultrashort laser pulses
Author(s): Eisuke Miura; Hiroshi Honda; Keisuke Katsura; Eiji Takahashi; Kiminori Kondo
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Properties of x-ray emission from rare gas clusters excited by ultrashort laser pulses were investigated. M-shell emissions from Xe clusters excited by Ti:sapphire and KrF laser pulses were compared under the same irradiation conditions. For the KrF laser irradiation, the absolute x- ray yield in the wavelength region from 0.8 nm to 1.6 nm was estimated to be 3 (mu) J/se per pulse, which was 20 times higher than that for the Ti:sapphire laser irradiation. Absolute x-ray yields in the wavelength region from 2 nm to 20 nm were measured for various rare gas clusters excited by a KrF laser pulse. For Xe, and x-ray conversion efficiency in the wavelength region from 5 nm to 20 nm was measured to be 1.1 percent sr, which was comparable to that for irradiating solid targets. The high x-ray conversion efficiency for Xe was brought about by the high absorption fraction of the laser light in the gas jet containing clusters.

Paper Details

Date Published: 11 January 2000
PDF: 11 pages
Proc. SPIE 3886, High-Power Lasers in Energy Engineering, (11 January 2000); doi: 10.1117/12.375124
Show Author Affiliations
Eisuke Miura, Electrotechnical Lab. (Japan) and Univ. of Tsukuba (Japan) (Japan)
Hiroshi Honda, Univ. of Tsukuba (Japan)
Keisuke Katsura, Univ. of Tsukuba (Japan)
Eiji Takahashi, Univ. of Tsukuba (Japan)
Kiminori Kondo, Univ. of Tsukuba (Japan)

Published in SPIE Proceedings Vol. 3886:
High-Power Lasers in Energy Engineering
Kunioki Mima; Gerald L. Kulcinski; William J. Hogan, Editor(s)

© SPIE. Terms of Use
Back to Top