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Proceedings Paper

Solid state laser devices of optical metrology
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Paper Abstract

A review of solid-state lasers used in optical metrology is presented. Various sources of laser parameters instabilities are discussed. Methods of laser output parameters stabilization are proposed. The solutions for Nd:YAG, Ti:sapphire, semiconductor, glass and fiber lasers are shortly presented and discussed. Possibilities and perspectives of use of different laser systems as standards for energy, power or frequency units are also shown.

Paper Details

Date Published: 13 December 1999
PDF: 5 pages
Proc. SPIE 4018, Optoelectronic Metrology, (13 December 1999); doi: 10.1117/12.373739
Show Author Affiliations
Andrzej Dlugaszek, Military Univ. of Technology (Poland)
Anatoliy I. Khizhnyak, Institute of Applied Optics (United States)
Igor I. Peshko, Institute of Physics (Ukraine)
Wojciech Skrzeczanowski, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 4018:
Optoelectronic Metrology
Jan Owsik; Tomasz Wiecek, Editor(s)

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