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Proceedings Paper

Reproduction of emissive power (self-calibration) using an emissive diode
Author(s): L. S. Lovinsky
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Paper Abstract

A new method of self-calibration of the emissive power of an emissive diode is presented here. The method involves a determination of the overall quantity of the thermal and emissive power released in a semiconductor-type radiating structure in the non-steady-state mode. According to a preliminary analysis it is characterized by satisfactory metrological characteristics.

Paper Details

Date Published: 13 December 1999
PDF: 3 pages
Proc. SPIE 4018, Optoelectronic Metrology, (13 December 1999); doi: 10.1117/12.373725
Show Author Affiliations
L. S. Lovinsky, All-Russian Research Institute for Optical and Physical Measurements (Russia)


Published in SPIE Proceedings Vol. 4018:
Optoelectronic Metrology
Jan Owsik; Tomasz Wiecek, Editor(s)

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