Share Email Print

Proceedings Paper

Photorefractive crystals for efficient linear sensing of speckle-pattern displacements
Author(s): Erik Raita; Alexei A. Kamshilin; Kimmo Paivasaari; Victor V. Prokofiev; Timo Jaeaeskelaeinen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Novel technique for the efficient remote sensing of speckle- pattern displacements is proposed. It is based on the polarization self-modulation effect recently discovered in photorefractive crystals. The technique provides linear responses on the amplitude of the lateral displacement and high sensitivity which is comparable with the interferometric one. Both sensitivity and dynamic range of measurements can be adjusted varying the average speckle size on the input face of crystal. The simple and inexpensive experimental set-up does not include any reference or read-out beam. Proposed technique can be applied for optical measurements of the transient motion of inspected surface such as object's vibration monitoring.

Paper Details

Date Published: 29 December 1999
PDF: 6 pages
Proc. SPIE 4016, Photonics, Devices, and Systems, (29 December 1999); doi: 10.1117/12.373634
Show Author Affiliations
Erik Raita, Univ. of Joensuu (Finland)
Alexei A. Kamshilin, Univ. of Joensuu (Finland)
Kimmo Paivasaari, Univ. of Joensuu (Finland)
Victor V. Prokofiev, Univ. of Joensuu (Finland)
Timo Jaeaeskelaeinen, Univ. of Joensuu (Finland)

Published in SPIE Proceedings Vol. 4016:
Photonics, Devices, and Systems
Miroslav Hrabovsky; Pavel Tomanek; Miroslav Miler, Editor(s)

© SPIE. Terms of Use
Back to Top