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Proceedings Paper

Radiation testing of electro-optic devices in compliance with IEEE 1156.4
Author(s): Roger A. Greenwell; David W. Pentrack; C. J. Pallach; Richard A. Tripoli; Larry A. Sadler; G. R. Waldsmith; Steven R. Terwilliger
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Paper Abstract

Cumulative effects on electro-optic devices are presented based on the test results of combined temperature, vacuum and total dose gamma irradiation. The survivability criteria were established in IEEE Standard 1156.4. Testing of a PIN diode and an infrared light emitting diode, under thermal vacuum conditions to a total dose of 2 Mrads, was undertaken.

Paper Details

Date Published: 7 December 1999
PDF: 11 pages
Proc. SPIE 3872, Photonics for Space and Radiation Environments, (7 December 1999); doi: 10.1117/12.373273
Show Author Affiliations
Roger A. Greenwell, Science and Engineering Associates, Inc. (United States)
David W. Pentrack, Defense Microelectronics Activity/U.S. Department of Defense (United States)
C. J. Pallach, Defense Microelectronics Activity/U.S. Department of Defense (United States)
Richard A. Tripoli, Science and Engineering Associates, Inc. (United States)
Larry A. Sadler, Science and Engineering Associates, Inc. (United States)
G. R. Waldsmith, Defense Microelectronics Activity/U.S. Department of Defense (United States)
Steven R. Terwilliger, Defense Microelectronics Activity/U.S. Department of Defense (United States)


Published in SPIE Proceedings Vol. 3872:
Photonics for Space and Radiation Environments
Edward W. Taylor; Francis Berghmans, Editor(s)

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