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Proceedings Paper

Derivation and validation of a new kernel for kernel-driven BRDF models
Author(s): Xiaowen Li; Feng Gao; Liangzan Chen; Alan H. Strahler
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Paper Abstract

Kernel-driven bidirectional reflectance (BRDF) models have recently been widely used for mapping albedo with multiangle remote sensing data such as ASAS or temporal AVHRR sequences. An Ambrals algorithm will be used to produce global BRDF and albedo products in the coming EOS era using multiangle reflectance data from the MODIS and MISR. Its operational version currently uses a combination of Ross-Thick and Li- Sparse-Reciprocal kernels which has been validated favorably over other kernels or combinations. To further improve the ability of extrapolation of the Ambrals kernel combination with better physical sense while keeping its data-fitting ability, a new kernel, Li-Transit, is derived and suggested to replace Li-Sparse-Reciprocal kernel in next version of Ambrals. We tested the new kernel combination against the current one and a few alternatives using 29 field collected BRDF data sets. The results show similar data fitting ability and more reliable extrapolation for albedo mapping. A test is also done by using the new combination and the current one to produce temporal albedo change maps of New England of U.S.A. using AVHRR images. Presented also is our recent study on scaling effect of Helmholtz principle of reciprocity, and discussion on application of a priori knowledge in kernel- driven BRDF model inversion.

Paper Details

Date Published: 17 December 1999
PDF: 12 pages
Proc. SPIE 3868, Remote Sensing for Earth Science, Ocean, and Sea Ice Applications, (17 December 1999); doi: 10.1117/12.373123
Show Author Affiliations
Xiaowen Li, Boston Univ. and Beijing Normal Univ. (United States)
Feng Gao, Boston Univ. and Nanjing Institute of Geography and Limnology (United States)
Liangzan Chen, Boston Univ. (United States)
Alan H. Strahler, Boston Univ. (United States)


Published in SPIE Proceedings Vol. 3868:
Remote Sensing for Earth Science, Ocean, and Sea Ice Applications
Giovanna Cecchi; Edwin T. Engman; Eugenio Zilioli, Editor(s)

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