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Proceedings Paper

Slope failure detection from temporal AVNIR images taken before and after the northwest Kagoshima-ken earthquake
Author(s): Sotaro Tanaka; Toshiro Sugimura; Shinzaburo Takatori; Yuzo Komaki
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Paper Abstract

This work aims to detect slope failures caused only by mechanical force of earthquake. In many cases so far, the pure detection where the slope failure occurred is not completed because that slope failures occurred with mixing the other events accompanying as heavy rain. To isolate the slope failure due to the mechanical stress of earthquake is important to consider why the slope failed. Our idea is to use the temporal high-resolution data as ADEOS/AVNIR ones just taken before and after the earthquake shock. In this experimental study, we found three slope failures on the sites induced by the main shock, on the northern mountainous region in Kagoshima. Extraction of slope failures purely caused by the earthquake-force serves analyzing the dynamical mechanics of slope failure. Three slopes failed at that time are flat and long about a few hundred meters with an inclination of about 45 degrees. Most of the slope failures have a size of few meters to a few tens of meters. Accuracy of satellite image is required within half DN values in radiometric and half pixel size in spatial. This work showed a practice of 8- meter resolution image to be applied for the detection of slope failures frequently happened by usual magnitude of earthquakes.

Paper Details

Date Published: 17 December 1999
PDF: 12 pages
Proc. SPIE 3868, Remote Sensing for Earth Science, Ocean, and Sea Ice Applications, (17 December 1999); doi: 10.1117/12.373112
Show Author Affiliations
Sotaro Tanaka, Remote Sensing Technology Ctr. of Japan (Japan)
Toshiro Sugimura, Remote Sensing Technology Ctr. of Japan (Japan)
Shinzaburo Takatori, Minami-nihon Consultant Co. (Japan)
Yuzo Komaki, Komaki Construction Co. (Japan)

Published in SPIE Proceedings Vol. 3868:
Remote Sensing for Earth Science, Ocean, and Sea Ice Applications
Giovanna Cecchi; Edwin T. Engman; Eugenio Zilioli, Editor(s)

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