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Proceedings Paper

Improving measurement resolution in white light interferometry
Author(s): Dongning Wang; Chester Shu
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Paper Abstract

In white light interferometry, the measurement resolution is limited relatively by the coherence length of the light source, usually in tens of fringes. By the use of two wavelength combination and multi-wavelength combination source approaches, the equivalent coherence length can be decreased to a few fringe level and nearly one fringe level respectively. By employing a discrete fringe pattern transform technique, the equivalent coherence length can be further reduced to a sub-fringe level, representing a high potential in high precision white light interferometric measurement.

Paper Details

Date Published: 9 December 1999
PDF: 7 pages
Proc. SPIE 3860, Fiber Optic Sensor Technology and Applications, (9 December 1999); doi: 10.1117/12.372979
Show Author Affiliations
Dongning Wang, Hong Kong Polytechnic Univ. (Hong Kong)
Chester Shu, Chinese Univ. of Hong Kong (Hong Kong)


Published in SPIE Proceedings Vol. 3860:
Fiber Optic Sensor Technology and Applications
Michael A. Marcus; Brian Culshaw, Editor(s)

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