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Proceedings Paper

FT-NIR spectroscopy for process control: recent case studies
Author(s): Stephen T. DeJesus; Basil A. Desousa; Sameer Londhe; Qian Wang
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Paper Abstract

Near-IR spectroscopy is the analysis of the light absorption and transmission characteristics of materials in the wavelength region extending from approximately 800 nm to 2500 nm, lying between the conventional mid-IR region at longer wavelengths and the visible region at shorter wavelengths.

Paper Details

Date Published: 9 December 1999
PDF: 13 pages
Proc. SPIE 3859, Optical Online Industrial Process Monitoring, (9 December 1999); doi: 10.1117/12.372941
Show Author Affiliations
Stephen T. DeJesus, Bruker Optics (United States)
Basil A. Desousa, Bruker Optics (United States)
Sameer Londhe, Bruker Optics (United States)
Qian Wang, Bruker Optics (United States)


Published in SPIE Proceedings Vol. 3859:
Optical Online Industrial Process Monitoring
Robert J. Nordstrom; Wim A. de Groot, Editor(s)

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