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Proceedings Paper

Multisensor fusion for geometric-part inspection
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Paper Abstract

Multiple off-the-shelf cameras can be configured to simultaneously provide a large variety of part features that are impossible to capture with a single CCD camera or range scanner. One unsolved problem is using several cameras for passive shape recognition is that of multi-view registration. Registration is the process of associating the feature vectors extracted from the image captured by one camera view with that from another view. This paper describes an unsupervised clustering algorithm used to associate redundant and complementary features extracted from different views of a 3D object for part identification and inspection. The unsupervised learning algorithm ensures that 'similar' feature vectors will be assigned to cluster units that lie in close spatial proximity in a 3D feature map. The technique reduces the dimensionality of the input by exploiting hidden redundancies in the training data. During the inspection phase, novel features activate a number of cluster nits that have weights similar to the applied training data. During the inspection phase, novel features activate a number of cluster units that have weights similar to the applied training input. If the sum- of-square error between the input and weights of the cluster unit with the strongest response is greater than a predefined tolerance, then the part is rejected. A simulation study is presented to illustrate how the proposed multi-sensor fusion technique can be applied to identifying parts for inspection.

Paper Details

Date Published: 24 November 1999
PDF: 12 pages
Proc. SPIE 3832, Sensors and Controls for Intelligent Machining and Manufacturing Mechatronics, (24 November 1999); doi: 10.1117/12.371188
Show Author Affiliations
George K. Knopf, Univ. of Western Ontario (Canada)
Jonathan Kofman, Univ. of Western Ontario (Canada)


Published in SPIE Proceedings Vol. 3832:
Sensors and Controls for Intelligent Machining and Manufacturing Mechatronics
Patrick F. Muir; George K. Knopf; Patrick F. Muir; Peter E. Orban, Editor(s)

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