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Proceedings Paper

Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry
Author(s): Guangbin Wang; Lisong Hou; Fuxi Gan
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Paper Abstract

New azo dye-doped polymer thin films have been made by spin- coating method on single-crystal silicon substrates. The complex dielectric function and optical parameters of the films have been measured with a fixed angle of incidence automatic spectroscopic ellipsometer. The electronic structure of the films has been explained.

Paper Details

Date Published: 30 November 1999
PDF: 5 pages
Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); doi: 10.1117/12.371164
Show Author Affiliations
Guangbin Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Lisong Hou, Shanghai Institute of Optics and Fine Mechanics (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 3806:
Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
Fernando Luis Podio, Editor(s)

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