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Proceedings Paper

Microscopic image analysis of defect areas in optical disks
Author(s): Pierre L'Hostis; Frederick Byers; Fernando Luis Podio; Xiao Tang
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Paper Abstract

This paper presents techniques developed at the Information Technology Laboratory of the U.S. National Institute of Standards and Technology (NIST/ITL) for enabling microscopic image analysis of optical data storage media such as optical disks. These non-destructive techniques allow investigators to easily locate on the media a pre-existing series of media defects. These techniques can be applied to any type of optical disks including CDs and DVDs. The paper describes the experimental setup and the techniques utilized to achieve localization and registration of media defects. These techniques include data acquisition, computer control, auto focus, image processing, and remote control and observation. An extension of this setup utilizing available graphical programming environments can allow investigators at different locations to share and discuss the information on media defects by use of the Internet.

Paper Details

Date Published: 30 November 1999
PDF: 7 pages
Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); doi: 10.1117/12.371152
Show Author Affiliations
Pierre L'Hostis, Information Technology Lab./National Institute of Standards and Technology (France)
Frederick Byers, Information Technology Lab./National Institute of Standards and Technology (United States)
Fernando Luis Podio, Information Technology Lab./National Institute of Standards and Technology (United States)
Xiao Tang, Information Technology Lab./National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3806:
Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
Fernando Luis Podio, Editor(s)

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