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Proceedings Paper

Methods for characterization of phase change optical disks
Author(s): Jerome Butty; Denis Kraehenbuehl; Brian Josef Bartholomeusz; Serguei Mikhailov; Masaru Suzuki
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Paper Abstract

Characterization methods of AgInSbTe based phase change optical disc are developed. Reflectivity change of as deposited multilayer structure with changing thickness is measured. The active layer thickness influence on reflectivity is compared with calculated results. We show that Rutherford Back Scattering (RBS) spectroscopy can be used to analyze the composition of the active layer. The X-ray diffraction pattern of CD-RW discs is presented, for both as deposited and initialized case. The TEM image reveals the particular crystal growth mechanism of AgInSbTe quaternary system. Written discs write power window is shown at 2X and 4X write speed.

Paper Details

Date Published: 30 November 1999
PDF: 8 pages
Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); doi: 10.1117/12.371148
Show Author Affiliations
Jerome Butty, Multi Media Masters & Machinery (Switzerland)
Denis Kraehenbuehl, Multi Media Masters & Machinery (Switzerland)
Brian Josef Bartholomeusz, Multi Media Masters & Machinery (United States)
Serguei Mikhailov, CAFI/EICN (Switzerland)
Masaru Suzuki, Asahi Chemical Industry Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 3806:
Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
Fernando Luis Podio, Editor(s)

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