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Proceedings Paper

Recent development of doubly curved crystal focusing optics and their applications for micro XRF
Author(s): Zewu Chen
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Paper Abstract

Three-dimensional focusing of x-rays can be achieved by doubly-curved crystals through diffraction from a small laboratory x-ray source. Recently it has been demonstrated that an intense monochromatic x-ray microprobe can be obtained with the use of a doubly-curved mica crystal. Due to monochromatic excitation using doubly-curved crystal optics, exceptionally low background has been demonstrated in the application to micro x-ray fluorescence (MXRF). Low background and high intensity gain significantly improve the detection limit for MXRF. In this paper, the focusing and diffraction properties of a doubly-curved Johann point-focusing crystal optic for Cu K(alpha) x-rays from a microfocus x-ray source is presented. Experimental data on spot size, beam intensity, effect of source position for the optics, and MXRF spectra are discussed.

Paper Details

Date Published: 23 November 1999
PDF: 7 pages
Proc. SPIE 3767, EUV, X-Ray, and Neutron Optics and Sources, (23 November 1999); doi: 10.1117/12.371109
Show Author Affiliations
Zewu Chen, X-Ray Optical Systems Inc. (United States)


Published in SPIE Proceedings Vol. 3767:
EUV, X-Ray, and Neutron Optics and Sources
Carolyn A. MacDonald; Kenneth A. Goldberg; Juan R. Maldonado; Huaiyu Heather Chen-Mayer; Stephen P. Vernon, Editor(s)

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