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Proceedings Paper

Polychromator five-channel x-ray/EUV spectrometer with imaging transmission grating for plasma diagnostics
Author(s): Dmitry A. Fedin; Victor L. Kantsyrev; Bruno S. Bauer; Alla S. Shlyaptseva; Igor Brytov
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Paper Abstract

A new multichannel x-ray/extreme ultra violet (EUV) spectrometer is developed for monitoring the time history of x-ray/EUV spectral line intensities from a hot plasma to estimate an electron density and temperature of plasmas. Each independently controlled channel includes a crystal (or multilayer mirror) and a fast x-ray diode. At the same time, an imaging transmission grating is applied to study a spatial distribution of spectral line intensities in a wide spectral region with time gated resolution. The multichannel spectrometer can be applied for measurements of polarization- dependent spectra which will be used for diagnostics of electron beams and measuring a magnetic field in z-pinch plasmas.

Paper Details

Date Published: 25 November 1999
PDF: 5 pages
Proc. SPIE 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III, (25 November 1999); doi: 10.1117/12.371101
Show Author Affiliations
Dmitry A. Fedin, Univ. of Nevada/Reno (United States)
Victor L. Kantsyrev, Univ. of Nevada/Reno (United States)
Bruno S. Bauer, Univ. of Nevada/Reno (United States)
Alla S. Shlyaptseva, Univ. of Nevada/Reno (United States)
Igor Brytov, Bourevestnik Inc. (United States)


Published in SPIE Proceedings Vol. 3764:
Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III
Silvano Fineschi; Bruce E. Woodgate; Randy A. Kimble, Editor(s)

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