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Proceedings Paper

X-ray polarimeters based on silicon PIN diodes and drift detectors
Author(s): Rainer Kotthaus; Gerd W. Buschhorn; Dmitry Pugachev; H. Shooshtari; Jan They
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Paper Abstract

A compact multidetector Compton polarimeter has been developed and calibrated to be used for energy resolved linear polarization analysis of X-rays in the energy range from about 3 to 20 keV. The polarization sensitivity of the polarimeter employing 4 thermoelectrically cooled silicon PIN photodiodes has been calibrated with monochromatized synchrotron radiation of known linear polarization. The scattering yields determine the polarization vector in one single measurement with an analyzing power of 76% and an uncertainty of the orientation of the polarization plane of less than 1 degree. The polarimeter is presently being used for linear polarization analysis of Parametric X-radiation (PXR) of about 11 keV emitted by 60.5 MeV electrons at an observation angle of 20 degrees. A second polarimeter with much improved spectroscopic performance and rate capabilities will employ X-ray detectors based on the principle of the semiconductor drift chamber. At a temperature of 260 K and a signal shaping time constant of 500 nsec an electronic noise contribution of 10 electrons (rms) has been measured. The drift detector polarimeter will be used to analyze PXR at backward observation angles.

Paper Details

Date Published: 25 November 1999
PDF: 12 pages
Proc. SPIE 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III, (25 November 1999); doi: 10.1117/12.371098
Show Author Affiliations
Rainer Kotthaus, Max-Planck-Institut fuer Physik (Germany)
Gerd W. Buschhorn, Max-Planck-Institut fuer Physik (Germany)
Dmitry Pugachev, Max-Planck-Institut fuer Physik (Germany)
H. Shooshtari, Max-Planck-Institut fuer Physik (Germany)
Jan They, Max-Planck-Institut fuer Physik (Germany)


Published in SPIE Proceedings Vol. 3764:
Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III
Silvano Fineschi; Bruce E. Woodgate; Randy A. Kimble, Editor(s)

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