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Proceedings Paper

Photon-counting intensified random-access charge injection device
Author(s): Timothy J. Norton; Patrick F. Morrissey; J. Patrick Haas; Leslie J. Payne; Joseph Carbone; Randy A. Kimble
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Paper Abstract

At NASA GSFC we are developing a high resolution solar-blind photon counting detector system for UV space based astronomy. The detector comprises a high gain MCP intensifier fiber- optically coupled to a charge injection device (CID). The detector system utilizes an FPGA based centroiding system to locate the center of photon events from the intensifier to high accuracy. The photon event addresses are passed via a PCI interface with a GPS derived time stamp inserted per frame to an integrating memory. Here we present imaging performance data which show resolution of MCP tube pore structure at an MCP pore diameter of 8 micrometer. This data validates the ICID concept for intensified photon counting readout. We also discuss correction techniques used in the removal of fixed pattern noise effects inherent in the centroiding algorithms used and present data which shows the local dynamic range of the device. Progress towards development of a true random access CID (RACID 810) is also discussed and astronomical data taken with the ICID detector system demonstrating the photon event time-tagging mode of the system is also presented.

Paper Details

Date Published: 25 November 1999
PDF: 12 pages
Proc. SPIE 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III, (25 November 1999); doi: 10.1117/12.371087
Show Author Affiliations
Timothy J. Norton, NASA Goddard Space Flight Ctr. (United States)
Patrick F. Morrissey, NASA Goddard Space Flight Ctr. (United States)
J. Patrick Haas, NASA Goddard Space Flight Ctr. (United States)
Leslie J. Payne, NASA Goddard Space Flight Ctr. (United States)
Joseph Carbone, NASA Goddard Space Flight Ctr. (United States)
Randy A. Kimble, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3764:
Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III
Silvano Fineschi; Bruce E. Woodgate; Randy A. Kimble, Editor(s)

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