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Proceedings Paper

Pendellosung fringes in distorted crystals
Author(s): M. D. Raransky; Igor M. Fodchuk; Ya. M. Struk; S. V. Bobrovnik
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Paper Abstract

Influences of slight and severe distortions, appearing under a focused load, on intensity oscillation in thickness of wedge-similar and flat Si crystals are investigated experimentally and by the numerical solution of Takagi equations. It is shown that scattering processes cause the bend and focusing (defocusing) x-ray trace during transmission through an environment with slowly varied refraction parameter in the case of slight distortions. In the region of severe distortions the processes of interbranch scattering take place.

Paper Details

Date Published: 18 November 1999
PDF: 6 pages
Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370436
Show Author Affiliations
M. D. Raransky, Chernivtsi State Univ. (Ukraine)
Igor M. Fodchuk, Chernivtsi State Univ. (Ukraine)
Ya. M. Struk, Chernivtsi State Univ. (Ukraine)
S. V. Bobrovnik, Chernivtsi State Univ. (Ukraine)

Published in SPIE Proceedings Vol. 3904:
Fourth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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