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Proceedings Paper

Multibeam Fizeau interferometer pattern localization
Author(s): Yuri N. Zakharov
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Paper Abstract

Fizeau interferometer pattern analysis have carried out in the case of arbitrary slope beam illumination. Analysis get localization plane location and its dependence on wedge relative index of refraction and on the interferometer entrance mirror slope angle to the incident wave. The analyses fits experiment.

Paper Details

Date Published: 18 November 1999
PDF: 2 pages
Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370411
Show Author Affiliations
Yuri N. Zakharov, Univ. Nizhni Novgorod (Russia)

Published in SPIE Proceedings Vol. 3904:
Fourth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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