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Proceedings Paper

Applications of FFT and digital filtering in reconstruction of refractive index profile of surface channel waveguides from near-field intensity pattern
Author(s): Hery Susanto Djie; Henri P. Uranus; M Muljono; John E. Batubara
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Paper Abstract

Refractive index profile of surface channel waveguides can be determined by analyzing the near-field intensity pattern. A mathematical model, the inverse Helmholtz equation, is derived in order to use these data to reconstruct the refractive index profile under consideration. In this work, the measured near-field intensities are preprocessed by means of gamma correction, background noise subtraction, Fast Fourier Transform, and low pass finite impulse response (FIR) digital filter. Several types of FIR windows are chosen. The results are used to reconstruct the refractive index profile of the waveguide. The results show that the application of low pass FIR digital filter by using Hamming window reduces noises better than other windows. The application of this method in determination of refractive index profile of annealed proton exchange LiNbO3 channel waveguides is demonstrated.

Paper Details

Date Published: 12 November 1999
PDF: 9 pages
Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); doi: 10.1117/12.370365
Show Author Affiliations
Hery Susanto Djie, Univ. of Pelita Harapan (Singapore)
Henri P. Uranus, Univ. of Pelita Harapan (Indonesia) and Univ. of Indonesia (Indonesia)
M Muljono, Univ. of Pelita Harapan (Indonesia)
John E. Batubara, Univ. of Pelita Harapan (Indonesia)


Published in SPIE Proceedings Vol. 3896:
Design, Fabrication, and Characterization of Photonic Devices
Marek Osinski; Soo-Jin Chua; Shigefusa F. Chichibu, Editor(s)

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