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Proceedings Paper

Structural, electrical, and optical properties of sol-gel-processed thin films of BaTiO3 on ITO glass
Author(s): Chan Hin Kam; Shi De Cheng; Yan Zhou; Kantisara Pita; X. Q. Han; Wenxiu Que; Hong Xi Zhang; Yee Loy Lam; Yuen Chuen Chan; Woon Siong Gan; Zhuo Sun; Xu Shi
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Paper Abstract

BaTiO3 thin films are prepared on ITO-coated Corning 1737 glass. The solution is prepared from a double metal ethoxide and the films are deposited by spin coating and annealing at 700°C for 2 hours in an O2 atmosphere. The films are characterized using x-ray diffraction, atomic force microscopy, micro-raman, UV-VIS spectroscopy, and Sawyer-Tower Bridge. The pure perovskite phase of BaTiO3 is identified by x-ray diffraction. The tetragonality is revealed from Raman study by identifying the symmetrical dependent Raman shift at about 306 cm-1. The ferroelectricity of the film is confirmed by the P-E hysteresis loop. The films are highly transparent, with an absorption edge at 3.73eV. These desirable features indicate that the films have potential in electronic display and electro-optical applications.

Paper Details

Date Published: 12 November 1999
PDF: 6 pages
Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); doi: 10.1117/12.370349
Show Author Affiliations
Chan Hin Kam, Nanyang Technological Univ. (Singapore)
Shi De Cheng, Nanyang Technological Univ. (Singapore)
Yan Zhou, Nanyang Technological Univ. (Singapore)
Kantisara Pita, Singapore Productivity and Standards Board (Singapore)
X. Q. Han, Nanyang Technological Univ. (Singapore)
Wenxiu Que, Nanyang Technological Univ. (Singapore)
Hong Xi Zhang, Nanyang Technological Univ. (Singapore)
Yee Loy Lam, Nanyang Technological Univ. (Singapore)
Yuen Chuen Chan, Nanyang Technological Univ. (Singapore)
Woon Siong Gan, Acoustical Technologies Singapore Pte. Ltd. (Singapore)
Zhuo Sun, Nanyang Technological Univ. (Singapore)
Xu Shi, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 3896:
Design, Fabrication, and Characterization of Photonic Devices

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