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Proceedings Paper

Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope
Author(s): Chi Wen Yang; Din Ping Tsai; Howard E. Jackson
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Paper Abstract

Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well- characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrast of the intensity gradients, the reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.

Paper Details

Date Published: 12 November 1999
PDF: 6 pages
Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); doi: 10.1117/12.370327
Show Author Affiliations
Chi Wen Yang, National Chung Cheng Univ. (Taiwan)
Din Ping Tsai, National Taiwan Univ. (Taiwan)
Howard E. Jackson, Univ. of Cincinnati (United States)


Published in SPIE Proceedings Vol. 3896:
Design, Fabrication, and Characterization of Photonic Devices
Marek Osinski; Soo-Jin Chua; Shigefusa F. Chichibu, Editor(s)

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