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Proceedings Paper

Metrology for optoelectronics
Author(s): Gordon W. Day
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Paper Abstract

This paper discusses measurement technology, standards, and traceability for the optoelectronics industry. Examples include the development of artifact standards, known as standard reference materials, for the calibration of instrumentation, and the calibration of laser and optical fiber power meters and detectors.

Paper Details

Date Published: 12 November 1999
PDF: 5 pages
Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); doi: 10.1117/12.370326
Show Author Affiliations
Gordon W. Day, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3896:
Design, Fabrication, and Characterization of Photonic Devices
Marek Osinski; Soo-Jin Chua; Shigefusa F. Chichibu, Editor(s)

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