Share Email Print

Proceedings Paper

Laser application in industrial close-range photogrammetry
Author(s): Francisco M. Sanchez Moreno; Jose M. Sebastian y Zuniga; David Garcia; A. L. Martinez; J. M. Gonzalez
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Close range photogrammetry for industrial applications is a demanding field of research. There are several groups in the world working towards a measuring system for quality control applications. Industrialists have realized that a picture is worth than one thousand measures and nowadays more and more off the shelf systems can be found in industrial facilities. However a fully automated vision-base 3D measurement robot is a complex system containing many components which constrain one another. Problems like solving the epipolar geometry in a non-structured environment, especially in real time applications, is still a very hard task. In this article a new laser system which solves the problems of correspondence and occlusions is presented. This laser scanner generates dynamically a grid of a large amount of lines. The projection lines are measured with subpixel precision with a binocular stereo mount. A very fast algorithm for detecting the intersection of lines with subpixel accuracy is described. Furthermore an interesting way for solving the correspondences between the two images is explained. Based on the fact that correspondence between the camera is solved, autocalibration can be performed on line.

Paper Details

Date Published: 16 November 1999
PDF: 8 pages
Proc. SPIE 3835, Three-Dimensional Imaging, Optical Metrology, and Inspection V, (16 November 1999); doi: 10.1117/12.370260
Show Author Affiliations
Francisco M. Sanchez Moreno, Univ. Politecnica de Madrid (Spain)
Jose M. Sebastian y Zuniga, Univ. Politecnica de Madrid (Spain)
David Garcia, Univ. Politecnica de Madrid (Spain)
A. L. Martinez, Univ. Politecnica de Madrid (Spain)
J. M. Gonzalez, Univ. Politecnica de Madrid (Spain)

Published in SPIE Proceedings Vol. 3835:
Three-Dimensional Imaging, Optical Metrology, and Inspection V
Kevin G. Harding, Editor(s)

© SPIE. Terms of Use
Back to Top