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Proceedings Paper

Advanced optical storage phosphor materials for erasable and rewritable optical memory utilizing photostimulated luminescence
Author(s): Hidehito Nanto; Tomoyuki Sato; Makoto Miyazaki; Atushi Imai; Hironobu Komori; Yoshiteru Douguchi; Eiji Kusano; Shouichi Nasu; Akira Kinbara
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Paper Abstract

The Boolean logic operations such as OR, AND and NOR are demonstrated using photostimulated luminescence (PSL) phenomenon in the imaging plate (IP) which is made by BaFBr:Eu photostimulable phosphor. The PSL in Eu and Sm co-doped SrS (SrS:Eu,Sm) phosphor ceramics is studied in order to develop a smart erasable and rewritable optical memory utilizing PSL phenomenon, because the SrS:Eu,Sm phosphor ceramics which are excited with UV-light or visible light exhibits an intense PSL, compared with that in UV-irradiated IP. Intense PSL with a peak at about 600 nm is observed in SrS:Eu,Sm phosphor ceramics which is stimulated with infrared light after irradiation with ultraviolet-(UV) light or visible-light. The PSL characteristics of SrS:Eu,Sm phosphor ceramics as a photostimulable material for the optical memory are reported.

Paper Details

Date Published: 22 November 1999
PDF: 8 pages
Proc. SPIE 3802, Advanced Optical Data Storage: Materials, Systems, and Interfaces to Computers, (22 November 1999); doi: 10.1117/12.370240
Show Author Affiliations
Hidehito Nanto, Kanazawa Institute of Technology (Japan)
Tomoyuki Sato, Kanazawa Institute of Technology (Japan)
Makoto Miyazaki, Kanazawa Institute of Technology (Japan)
Atushi Imai, Kanazawa Institute of Technology (Japan)
Hironobu Komori, Kanazawa Institute of Technology (Japan)
Yoshiteru Douguchi, Industrial Research Institute of Ishikawa (Japan)
Eiji Kusano, Kanazawa Institute of Technology (Japan)
Shouichi Nasu, Kanazawa Institute of Technology (Japan)
Akira Kinbara, Kanazawa Institute of Technology (Japan)


Published in SPIE Proceedings Vol. 3802:
Advanced Optical Data Storage: Materials, Systems, and Interfaces to Computers
Pericles A. Mitkas; Zameer U. Hasan; Hans J. Coufal; Glenn T. Sincerbox, Editor(s)

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