Share Email Print
cover

Proceedings Paper

Orientational correlations in liquid crystalline systems revealed by polarization-analyzed resonant x-ray scattering
Author(s): Ronald Pindak; Peter Mach; Anne-Marie Levelut; Philippe Barois; Cheng-Cher Huang; Lars Furenlid
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The existence of a helical symmetry axis is widespread in systems exhibiting liquid-crystalline order, especially in systems comprised of chiral molecules. Because these systems usually lack three-dimensional positional order, the helical symmetry axis cannot be observed using conventional x-ray scattering. Since the nature of the helical ordering determines the electro-optic response of the liquid crystal phases, it is a crucial structural feature to establish. Important for device applications are the various chiral smectic-C (SmC*) liquid crystal phases that are composed of fluid-like layers of tilted molecules. The electro-optic response of these phases varies from ferro to ferri to antiferroelectric. To elucidate the structure of the SmC* phases, we did resonant x-ray scattering at the sulfur K-edge on sulfur containing compounds. Our polarization-analyzed measurements of the resonant diffraction provided unambiguous evidence that the in-plane tilt direction in these phases exhibits a helical interlayer orientational ordering with a short pitch equals vd where d is the layer spacing. In the lowest temperature SmC* phase, which has antiferroelectric ordering, v was close to 2. At higher temperatures, the ferrielectric phases had v equals 3, then 4, and finally, an incommensurate value varying between 5 and 8 with increasing temperature.

Paper Details

Date Published: 16 November 1999
PDF: 10 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370103
Show Author Affiliations
Ronald Pindak, Lucent Technologies/Bell Labs. (United States)
Peter Mach, Univ. of Minnesota/Twin Cities (United States)
Anne-Marie Levelut, Univ. de Paris-Sud (France)
Philippe Barois, Univ. de Bordeaux I (France)
Cheng-Cher Huang, Univ. of Minnesota/Twin Cities (United States)
Lars Furenlid, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)

© SPIE. Terms of Use
Back to Top